Proceedings from the Second Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor Systems

by Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor-Insulator Systems (2nd 1989 Microelectronics Center of North Carolina)

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Published 1989 by MCNC in Research Triangle Park, NC .
Written in English

Subjects:

• Integrated circuits -- Effect of radiation on -- Congresses.,
• Semiconductors -- Defects -- Congresses.,
• Semiconductors -- Effect of radiation on -- Congresses.

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Edition Notes

Statement	editor, A. Reisman ; sponsored by the Microelectronics Center of North Carolina, North Carolina State University, and the University of North Carolina at Charlotte, in cooperation with the Semiconductor Research Corporation and the Electron Devices Society of the Institute of Electrical and Electronics Engineers.
Contributions	Reisman, A., Microelectronics Center of North Carolina., North Carolina State University., University of North Carolina at Charlotte.
Classifications
LC Classifications	TK7871.85 .W67 1989
The Physical Object
Pagination	333 p. :
Number of Pages	333
ID Numbers
Open Library	OL2230417M
LC Control Number	89084215
OCLC/WorldCa	21649681

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