2 edition of Proceedings from the Second Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor Systems found in the catalog.
Proceedings from the Second Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor Systems
Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor-Insulator Systems (2nd 1989 Microelectronics Center of North Carolina)
|Statement||editor, A. Reisman ; sponsored by the Microelectronics Center of North Carolina, North Carolina State University, and the University of North Carolina at Charlotte, in cooperation with the Semiconductor Research Corporation and the Electron Devices Society of the Institute of Electrical and Electronics Engineers.|
|Contributions||Reisman, A., Microelectronics Center of North Carolina., North Carolina State University., University of North Carolina at Charlotte.|
|LC Classifications||TK7871.85 .W67 1989|
|The Physical Object|
|Pagination||333 p. :|
|Number of Pages||333|
|LC Control Number||89084215|
FORMOSAN RUBBER GROUP INC
Trenching and Sampling of the Rhyolite Mercury Prospect, Kuskokwim River Basin, Alaska.
agreements with the United States before the Mexican Senate.
Tourism in the south west region
Human factors guide for nuclear power plant control room development
Wild ducks on farmland in the South
My journey through the twentieth century
Rebuilding lives after domestic violence
A selection of revised and unpublished Norfolk pedigrees.